Research on advanced manipulation and imaging strategies of atomic force microscopy (AFM) systems.

  • Experimental platform


  • Based on machine learning, computer vision, and path planning, advanced imaging optimization algorithms are designed to improve the imaging quality of the AFM.


  • By designing automated nanoscale characterization methods, desired micro-nano patterns are accurately depicted on the sample surface via the AFM probe.


  • The research on automated grab, injection and extraction of cells are carried out via the AFM hollow probe, so as to provide the possibility for solving interdisciplinary problems at the micro-nano scale.